• DocumentCode
    1559494
  • Title

    Anomaly detection in embedded systems

  • Author

    Maxion, Roy A. ; Tan, Kymie M C

  • Author_Institution
    Dept. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    51
  • Issue
    2
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    108
  • Lastpage
    120
  • Abstract
    By employing fault tolerance, embedded systems can withstand both intentional and unintentional faults. Many fault tolerance mechanisms are invoked only after a fault has been detected by whatever fault-detection mechanism is used; hence, the process of fault detection must itself be dependable if the system is expected to be fault-tolerant. Many faults are detectable only indirectly as a result of performance disorders that manifest as anomalies in monitored system or sensor data. Anomaly detection, therefore, is often the primary means of providing early indications of faults. As with any other kind of detector, one seeks full coverage of the detection space with the anomaly detector being used. Even if coverage of a particular anomaly detector falls short of 100%, detectors can be composed to effect broader coverage, once their respective sweet spots and blind regions are known. This paper provides a framework and a fault-injection methodology for mapping an anomaly detector´s effective operating space and shows that two detectors, each designed to detect the same phenomenon, may not perform similarly, even when the event to be detected is unequivocally anomalous and should be detected by either detector. Both synthetic and real-world data are used
  • Keywords
    embedded systems; fault tolerant computing; system monitoring; anomaly detection; blind regions; detection space coverage; embedded systems; fault detection dependability; fault tolerance; fault-injection methodology; intentional faults; monitored sensor data; monitored system data; operating space; performance disorders; sweet spots; unintentional faults; Embedded system;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.980003
  • Filename
    980003