DocumentCode :
1559498
Title :
ED4I: error detection by diverse data and duplicated instructions
Author :
Oh, Nahmsuk ; Mitra, Subhasish ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
Volume :
51
Issue :
2
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
180
Lastpage :
199
Abstract :
Errors in computing systems can cause abnormal behavior and degrade data integrity and system availability. Errors should be avoided especially in embedded systems for critical applications. However, as the trend in VLSI technologies has been toward smaller feature sizes, lower supply voltages and higher frequencies, there is a growing concern about temporary errors as well as permanent errors in embedded systems; thus, it is very essential to detect those errors. Software-implemented hardware fault tolerance (SIHFT) is a low-cost alternative to hardware fault-tolerance techniques for embedded processors: It does not require any hardware modification of commercial off-the-shelf (COTS) processors. ED4I (error detection by data diversity and duplicated instructions) is a SIHFT technique that detects both permanent and temporary errors by executing two "different" programs (with the same functionality) and comparing their outputs. ED4I maps each number, x, in the original program into a new number x\´, and then transforms the program so that it operates on the new numbers so that the results can be mapped backwards for comparison with the results of the original program. The mapping in the transformation of ED4I is x\´ = k·x for integer numbers, where kf determines the fault detection probability and data integrity of the system. For floating-point numbers, we find a value of kf for the fraction and ke for the exponent separately, and use k = kf×2k for the value of k. We have demonstrated how to choose an optimal value of k for the transformation. This paper shows that, for integer programs, the transformation with k = -2 was the most desirable choice in six out of seven benchmark programs we simulated. It maximizes the fault detection probability under the condition that the data integrity is highest
Keywords :
data integrity; embedded systems; error detection; fault tolerant computing; ED4I; SIHFT; VLSI technologies; abnormal behavior; benchmark programs; commercial off-the-shelf processors; computing system errors; concurrent error detection; critical applications; data diversity; data integrity; diverse data; duplicated instructions; embedded processors; embedded systems; error detection; fault detection probability; feature sizes; floating point numbers; functionally equivalent program execution; high-frequency operation; integer numbers; mapping transformation; permanent errors; program output comparison; software-implemented hardware fault tolerance; supply voltages; system availability; temporary errors; Application software; Degradation; Embedded system; Fault detection; Fault tolerance; Frequency; Hardware; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.980007
Filename :
980007
Link To Document :
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