Title :
Calculation of bending losses in dielectric waveguides using eigenmode expansion and perfectly matched layers
Author :
Bienstman, Peter ; Six, E. ; Roelens, M. ; Vanwolleghem, M. ; Baets, Roel
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Gent, Belgium
Abstract :
In this letter, we present a different approach to accurately calculate the bending losses in curved dielectric waveguides. It is based on the well-known conformal transformation of the index profile and on vectorial eigenmode expansion, but this time with perfectly matched layer (PML) boundary conditions to accurately model radiation losses. The modal spectrum of these waveguides in the presence of PML is discussed and the method is validated by comparing it to previously published results.
Keywords :
coupled mode analysis; eigenvalues and eigenfunctions; optical dispersion; optical losses; optical waveguide theory; waveguide discontinuities; absorbing boundary conditions; bending losses; conformal transformation; curved dielectric waveguides; dispersion relation; eigenmode expansion; index profile; modal spectrum; optimal offset; perfectly matched layer boundary conditions; propagation constants; radiation losses; vectorial eigenmode expansion; waveguide bends; Boundary conditions; Dielectric losses; Geometry; Optical losses; Optical reflection; Perfectly matched layers; Photonic integrated circuits; Propagation losses; Two dimensional displays; Waveguide theory;
Journal_Title :
Photonics Technology Letters, IEEE
