DocumentCode :
1559739
Title :
A study of soft and hard breakdown - Part I: Analysis of statistical percolation conductance
Author :
Alam, Muhammad Ashraful ; Weir, Bonnie E. ; Silverman, Paul J.
Author_Institution :
Agere Syst., Murray Hill, NJ, USA
Volume :
49
Issue :
2
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
232
Lastpage :
238
Abstract :
A theory of the statistical origin of soft and hard breakdown, that can explain a wide range of experimental data, is proposed. The theory is based on the simple premise that the severity of breakdown depends on the magnitude of the power dissipation through the sample-specific, statistically distributed percolation conductance, rather than on any physical difference between the traps involved. This model (a) establishes the connection between the statistical distribution of the theoretically predicted percolation conductance and the distribution of experimentally measured conductances after soft breakdown (Part I), and (b) explains the thickness, voltage, stress, and circuit configuration dependence of soft and hard breakdown (Part II). Connections to previous theories are made explicit, and contradictions to alternate models are resolved
Keywords :
electric breakdown; electrical conductivity; percolation; hard breakdown; percolation conductance; power dissipation; soft breakdown; statistical distribution; Breakdown voltage; Capacitors; Circuits; Degradation; Electric breakdown; Power dissipation; Semiconductor device breakdown; Semiconductor films; Statistical distributions; Stress;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.981212
Filename :
981212
Link To Document :
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