DocumentCode
1559739
Title
A study of soft and hard breakdown - Part I: Analysis of statistical percolation conductance
Author
Alam, Muhammad Ashraful ; Weir, Bonnie E. ; Silverman, Paul J.
Author_Institution
Agere Syst., Murray Hill, NJ, USA
Volume
49
Issue
2
fYear
2002
fDate
2/1/2002 12:00:00 AM
Firstpage
232
Lastpage
238
Abstract
A theory of the statistical origin of soft and hard breakdown, that can explain a wide range of experimental data, is proposed. The theory is based on the simple premise that the severity of breakdown depends on the magnitude of the power dissipation through the sample-specific, statistically distributed percolation conductance, rather than on any physical difference between the traps involved. This model (a) establishes the connection between the statistical distribution of the theoretically predicted percolation conductance and the distribution of experimentally measured conductances after soft breakdown (Part I), and (b) explains the thickness, voltage, stress, and circuit configuration dependence of soft and hard breakdown (Part II). Connections to previous theories are made explicit, and contradictions to alternate models are resolved
Keywords
electric breakdown; electrical conductivity; percolation; hard breakdown; percolation conductance; power dissipation; soft breakdown; statistical distribution; Breakdown voltage; Capacitors; Circuits; Degradation; Electric breakdown; Power dissipation; Semiconductor device breakdown; Semiconductor films; Statistical distributions; Stress;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.981212
Filename
981212
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