• DocumentCode
    1559739
  • Title

    A study of soft and hard breakdown - Part I: Analysis of statistical percolation conductance

  • Author

    Alam, Muhammad Ashraful ; Weir, Bonnie E. ; Silverman, Paul J.

  • Author_Institution
    Agere Syst., Murray Hill, NJ, USA
  • Volume
    49
  • Issue
    2
  • fYear
    2002
  • fDate
    2/1/2002 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    238
  • Abstract
    A theory of the statistical origin of soft and hard breakdown, that can explain a wide range of experimental data, is proposed. The theory is based on the simple premise that the severity of breakdown depends on the magnitude of the power dissipation through the sample-specific, statistically distributed percolation conductance, rather than on any physical difference between the traps involved. This model (a) establishes the connection between the statistical distribution of the theoretically predicted percolation conductance and the distribution of experimentally measured conductances after soft breakdown (Part I), and (b) explains the thickness, voltage, stress, and circuit configuration dependence of soft and hard breakdown (Part II). Connections to previous theories are made explicit, and contradictions to alternate models are resolved
  • Keywords
    electric breakdown; electrical conductivity; percolation; hard breakdown; percolation conductance; power dissipation; soft breakdown; statistical distribution; Breakdown voltage; Capacitors; Circuits; Degradation; Electric breakdown; Power dissipation; Semiconductor device breakdown; Semiconductor films; Statistical distributions; Stress;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.981212
  • Filename
    981212