DocumentCode
1559753
Title
Transparent and quasi-transparent regional solutions to minority-carrier transport in arbitrarily doped semiconductors
Author
Abenante, Luigi
Author_Institution
ENEA, Rome, Italy
Volume
49
Issue
2
fYear
2002
fDate
2/1/2002 12:00:00 AM
Firstpage
329
Lastpage
331
Abstract
The exact analytical regional solution to minority-carrier transport is derived in arbitrarily doped transparent semiconductor regions. By using this solution, new regional quasi-transparent solutions for emitter light-generated current density are derived in both the Cuevas and Balbuena approach (Cuevas and Balbuena, IEEE Trans. Electron Devices, vol. 36, pp. 553-560, 1989) and the Hamel approach (Hamel, IEEE Trans. Electron Devices, vol. 46, pp. 104-109, 1996) . Either of the new third-order quasi-transparent expressions is shown to be more accurate than both the local second-order quasi-transparent expression of Cuevas and Balbuena and the third-order regional expression of Bisschop et al (IEEE Trans. Electron Devices, vol. 37, pp. 358-364, 1990). In particular, while the new expression derived according to Hamel is more accurate at passivated surfaces, the new expression derived according to Cuevas and Balbuena is always more accurate, except for the case of a negligible surface recombination, where it is as accurate as the third-order regional expression of Bisschop et al
Keywords
current density; doping profiles; interface states; minority carriers; passivation; semiconductors; surface recombination; transparency; Cuevas Balbuena approach; Hamel approach; analytical regional solution; arbitrarily doped semiconductors; arbitrarily doped transparent semiconductor regions; emitter light-generated current density; local second-order quasi-transparent expression; minority-carrier transport; modeling; passivated surfaces; quasi-transparent regional solutions; regional quasi-transparent solutions; simulation; surface recombination; third-order quasi-transparent expressions; third-order regional expression; transparent regional solutions; transport equations; Analytical models; Boundary conditions; Charge carrier processes; Current density; Electron emission; Integral equations; Lighting; Performance analysis; Radiative recombination; Steady-state;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.981226
Filename
981226
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