DocumentCode
1559772
Title
Monolithic transistor SPST switch for L-band
Author
Torres, Jorge Alves ; Freire, J. Costa
Author_Institution
Instituto de Telecomunicacoes, Instituto Superior de Engenharia de Lisboa, Lisbon, Portugal
Volume
50
Issue
1
fYear
2002
fDate
1/1/2002 12:00:00 AM
Firstpage
51
Lastpage
56
Abstract
A comparison of single-pole single-throw switch topologies is presented in this paper. A three-MESFET monolithic GaAs switch was designed, for 2-GHz operation, fabricated and tested in three different bias conditions: Vbias = 0 (self-bias); Ibias = 0 (floating); and Vbias ≠ 0, Ibias ≠ 0 (biased). It will be shown that a floating configuration presents on-state lower insertion loss (IL) (~1.7 dB). However, the off-state isolation has the same order of magnitude in all three bias conditions (typically 50 dB). Comparing measurements and simulations, the best available nonlinear model for the floating bias operation was selected. Finally, several resonant topologies were studied and a new topology is proposed to increase the off-state isolation without degrading the on-state IL. The advantages and drawbacks of resonant topologies over nonresonant configurations are also discussed, taking into account technology constraints and operation frequency. A solution to reduce the inductor value is proposed
Keywords
III-V semiconductors; MESFET integrated circuits; UHF integrated circuits; field effect MMIC; field effect transistor switches; gallium arsenide; microwave switches; 1.7 dB; 2 GHz; GaAs; III V semiconductors; L-band; SPST switch; bias conditions; floating bias operation; floating configuration; nonlinear model; off-state isolation; on-state lower insertion loss; operation frequency; resonant topologies; single-pole single-throw switch topologies; technology constraints; three-MESFET monolithic switch; Automatic testing; Degradation; Frequency; Gallium arsenide; Insertion loss; Isolation technology; L-band; Resonance; Switches; Topology;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.981245
Filename
981245
Link To Document