• DocumentCode
    1559816
  • Title

    A physical frequency-dependent compact model for RF integrated inductors

  • Author

    Sieiro, Javier ; López-Villegas, José M. ; Cabanillas, José ; Osorio, Joan A. ; Samitier, Josep

  • Author_Institution
    Dept. of Electron., Barcelona Univ., Spain
  • Volume
    50
  • Issue
    1
  • fYear
    2002
  • fDate
    1/1/2002 12:00:00 AM
  • Firstpage
    384
  • Lastpage
    392
  • Abstract
    A frequency-dependent compact model for inductors in high ohmic substrates, which is based on an energy point-of-view, is developed. This approach enables the description of the most important coupling phenomena that take place inside the device. Magnetically induced losses are quite accurately calculated and coupling between electric and magnetic fields is given by means of a delay constant. The later coupling phenomenon provides a modified procedure for the computation of the fringing capacitance value, when the self-resonance frequency of the inductor is used as a fitting parameter. The model takes into account the width of every metal strip and the pitch between strips. This enables the description of optimized layout inductors. Data from experiments and electromagnetic simulators are presented to test the accuracy of the model
  • Keywords
    MMIC; UHF integrated circuits; eddy current losses; electromagnetic coupling; equivalent circuits; inductors; integrated circuit layout; integrated circuit modelling; resonance; RF integrated inductors; RFICs; coupling phenomena; delay constant; eddy currents; fitting parameter; frequency-dependent compact model; fringing capacitance value; high ohmic substrates; inductor layout optimization; magnetically induced losses; metal strip width; optimized layout inductors; pitch; self-resonance frequency; Capacitance; Computational modeling; Couplings; Delay; Inductors; Magnetic fields; Magnetic losses; Radio frequency; Strips; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.981290
  • Filename
    981290