Microwave properties of low-loss polymers at cryogenic temperatures

Author

Jacob, Mohan V. ; Mazierska, Janina ; Leong, Kenneth ; Krupka, Jerzy

Author_Institution

Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia

Volume

50

Issue

2

fYear

2002

fDate

2/1/2002 12:00:00 AM

Firstpage

474

Lastpage

480

Abstract

Dielectric loss tangent and permittivity of polytetrafluoroethylene (Teflon), high-density (HD) polyethylene, and cross-linked polystyrene (Rexolite) were measured at temperature range from 28 to 84 K and frequency of approximately 18 GHz. The material properties were determined by measurements of the resonant frequency and the Q factor of a TE₀₁₁ mode cylindrical superconducting cavity containing a sample under test. It has been demonstrated that these materials exhibit very low losses at cryogenic temperatures (2×10^-6 for Teflon, 5×10^-5 for HD polyethylene and 1.1×10^-4 for Rexolite). Due to low losses, these materials can be useful in construction of various high-Q factor microwave devices for operation at cryogenic temperatures

Keywords

Q-factor; cryogenics; dielectric losses; dielectric materials; microwave materials; permittivity; polymers; 18 GHz; 28 to 84 K; Q-factor; Rexolite; Teflon; cross-linked polystyrene; cryogenic temperature; cylindrical superconducting cavity; dielectric loss tangent; high-density polyethylene; microwave properties; permittivity; polymer; polytetrafuoroethylene; resonant frequency; Cryogenics; Dielectric loss measurement; Dielectric measurements; Frequency measurement; High definition video; Permittivity measurement; Polyethylene; Polymers; Superconducting materials; Temperature measurement;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.982226

Filename

982226