DocumentCode
1560263
Title
Aging studies of PBGA solder joints reflowed at different conveyor speeds
Author
Fan, S.H. ; Chan, Y.C. ; Tang, C.W. ; Lai, J.K.L.
Author_Institution
Dept. of Electron. Eng., City Univ. of Hong Kong, China
Volume
24
Issue
4
fYear
2001
fDate
11/1/2001 12:00:00 AM
Firstpage
486
Lastpage
492
Abstract
In this paper, the shear cycle fatigue properties of plastic ball grid array (PBGA) assemblies\´ solder joints reflowed with three different profiles, and aged at 125°C for four, nine, 16, 25, and 36 days are studied. The profiles were devised to have the same "heating factor," which was defined as the integral of the measured temperature above the liquidus (183°C) with respect to dwell time in the reflow profile, but to have different conveyor speeds. The effects of conveyor speed on the solder joint (nonaged and aged) fatigue lifetimes were investigated. It was found hat with increasing the conveyor speed the solder joint shear fatigue lifetime could be improved substantially. Also, the shear fatigue lifetimes of aged solder joints decreased with increasing aging time and variation in fatigue lifetimes increased for faster conveyor speed. SEM and optical micrographs show that faster cooling rate caused a rougher interface of solder/IMC and less crystallization microstructure in solder joints. Rougher interface solder joints have a longer nonaged fatigue life. The thickness of IMC increases with increasing aging time and the growth rate for solder with faster cooling rate was larger. SEM cross section views reveal that cracks initiated at the acute position near the solder pad, then propagated along the interface of the bulk solder/IMC layer. Thicker IMC layers deteriorated fatigue life, so the fatigue lifetime variation of aged solder joints with fast cooling rate was larger
Keywords
ageing; ball grid arrays; chemical interdiffusion; fatigue; plastic packaging; reflow soldering; reliability; shear strength; thermal management (packaging); thermal stresses; 125 C; 4 to 36 day; PBGA solder joints; SEM; Weibull slope; aging studies; different conveyor speed reflowed; diffusion behavior; dwell time; heating factor; intermetallic compound layer growth; microstructural evolution; optical micrographs; reliability; rougher interface; shear cycle fatigue properties; shear fatigue lifetimes; solder alloy microstructure; Aging; Assembly; Cooling; Electronics packaging; Fatigue; Heating; Plastics; Soldering; Temperature measurement; Velocity measurement;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/6040.982834
Filename
982834
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