• DocumentCode
    1560263
  • Title

    Aging studies of PBGA solder joints reflowed at different conveyor speeds

  • Author

    Fan, S.H. ; Chan, Y.C. ; Tang, C.W. ; Lai, J.K.L.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, China
  • Volume
    24
  • Issue
    4
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    486
  • Lastpage
    492
  • Abstract
    In this paper, the shear cycle fatigue properties of plastic ball grid array (PBGA) assemblies\´ solder joints reflowed with three different profiles, and aged at 125°C for four, nine, 16, 25, and 36 days are studied. The profiles were devised to have the same "heating factor," which was defined as the integral of the measured temperature above the liquidus (183°C) with respect to dwell time in the reflow profile, but to have different conveyor speeds. The effects of conveyor speed on the solder joint (nonaged and aged) fatigue lifetimes were investigated. It was found hat with increasing the conveyor speed the solder joint shear fatigue lifetime could be improved substantially. Also, the shear fatigue lifetimes of aged solder joints decreased with increasing aging time and variation in fatigue lifetimes increased for faster conveyor speed. SEM and optical micrographs show that faster cooling rate caused a rougher interface of solder/IMC and less crystallization microstructure in solder joints. Rougher interface solder joints have a longer nonaged fatigue life. The thickness of IMC increases with increasing aging time and the growth rate for solder with faster cooling rate was larger. SEM cross section views reveal that cracks initiated at the acute position near the solder pad, then propagated along the interface of the bulk solder/IMC layer. Thicker IMC layers deteriorated fatigue life, so the fatigue lifetime variation of aged solder joints with fast cooling rate was larger
  • Keywords
    ageing; ball grid arrays; chemical interdiffusion; fatigue; plastic packaging; reflow soldering; reliability; shear strength; thermal management (packaging); thermal stresses; 125 C; 4 to 36 day; PBGA solder joints; SEM; Weibull slope; aging studies; different conveyor speed reflowed; diffusion behavior; dwell time; heating factor; intermetallic compound layer growth; microstructural evolution; optical micrographs; reliability; rougher interface; shear cycle fatigue properties; shear fatigue lifetimes; solder alloy microstructure; Aging; Assembly; Cooling; Electronics packaging; Fatigue; Heating; Plastics; Soldering; Temperature measurement; Velocity measurement;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.982834
  • Filename
    982834