DocumentCode :
1560264
Title :
Reaction of solder with Ni/Au metallization for electronic packages during reflow soldering
Author :
Ho, C.E. ; Tsai, S.Y. ; Kao, C.R.
Author_Institution :
Dept. of Chem. & Mater. Eng., Nat. Central Univ., Chungli City, Taiwan
Volume :
24
Issue :
4
fYear :
2001
fDate :
11/1/2001 12:00:00 AM
Firstpage :
493
Lastpage :
498
Abstract :
Gold over Ni is one of the most common surface finishes for Cu soldering pads in ball-grid-array (BGA) and other electronic packages. The Au layer is for oxidation protection, and the Ni layer serves as a solderable diffusion barrier. In this study, eutectic Pb-Sn solder-balls were reflowed on the Au/Ni/Cu pads, and the chemical interactions between the solder and the surface finish were studied. Quenched-in microstructures at different stages of the reflow were carefully examined using the scanning electron microscopy. It was found that the solder melted locally along the solder/pad interface at the very early stages of the reflow before the whole solder ball had reached the Pb-Sn eutectic temperature. This was because a ternary eutectic reaction L=(Pb)+(Sn)+AuSn4 occurred at 177°C, six degrees below the Pb-Sn eutectic temperature. Four distinct stages were identified for the reflow process. The four stages are: (1) partial melting of solder balls and the initial reaction of Au with Sn; (2) complete reaction of An with Sn; (3) separation of (AuxNi1-x)Sn4 from the pad; (4) complete melting of solder balls and the reaction of Ni with Sn. After a typical reflow, with a 225°C peak reflow temperature and 115 s reflow time, all the An and Au-bearing intermetallic compounds left the interface and the only intermetallic compound at the interface was Ni3Sn4 with a thickness of about 2 μm
Keywords :
ball grid arrays; chemical interdiffusion; diffusion barriers; dissolving; gold; melting; metallisation; nickel; reflow soldering; scanning electron microscopy; 177 C; 225 C; Au-Ni-Cu; Ni3Sn4; PbSn; chemical interactions; complete melting; dissolution; electronic packaging; eutectic solder-balls; intermetallic compounds; metallization; oxidation protection; partial melting; quenched-in microstructures; reflow soldering; scanning electron microscopy; solder reaction; solderable diffusion barrier; surface finish; ternary eutectic reaction; Electronics packaging; Gold; Intermetallic; Metallization; Oxidation; Protection; Soldering; Surface finishing; Temperature; Tin;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.982835
Filename :
982835
Link To Document :
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