• DocumentCode
    1560269
  • Title

    A hybrid 2-D ADI-FDTD subgridding scheme for modeling on-chip interconnects

  • Author

    Wang, Bing-Zhong ; Wang, Yingjun ; Yu, Wenhua ; Mittra, Raj

  • Author_Institution
    Inst. of Appl. Phys., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    24
  • Issue
    4
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    533
  • Abstract
    This paper presents a novel technique for extracting the propagation characteristics of on-chip interconnects. A hybrid two-dimensional subgridding scheme, based on a combination of the finite-difference time-domain (FDTD) method and the alternating-direction implicit (ADI-)FDTD technique, is utilized. The ADI-FDTD scheme is used for fine grid in the vicinity of the metallic etch, while the coarse FDTD grid is used outside this region. The advantage of the ADI-FDTD scheme is that it can be synchronized with the time marching step employed in the coarse FDTD scheme, obviating the need for the temporal interpolation of the fields in the process. This helps to render the hybrid ADI-FDTD subgridding scheme to be more efficient than the conventional FDTD subgridding algorithm in terms of the run time. The phase and attenuation constants of the dominant mode of a lossy stripline are computed by the proposed scheme to validate the technique
  • Keywords
    finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; strip lines; alternating-direction implicit technique; attenuation constants; finite-difference time-domain method; hybrid 2D ADI-FDTD subgridding algorithm; lossy stripline; on-chip interconnect; phase constants; propagation characteristics; Conducting materials; Conductors; Etching; Finite difference methods; Frequency; Integrated circuit interconnections; Skin; Stability; Stripline; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.982840
  • Filename
    982840