• DocumentCode
    1560272
  • Title

    Electrical performance improvements on RFICs using bump chip carrier packages as compared to standard thin shrink small outline packages

  • Author

    Horng, Tzyy-Sheng ; Wu, Sung-Mao ; Chiu, Chi-Tsung ; Hung, Chih-Pin

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    24
  • Issue
    4
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    548
  • Lastpage
    554
  • Abstract
    The electrical models of bump chip carrier (BCC) packages have been established based on the S-parameter measurement. When compared to the standard thin shrink small outline packages (TSSOPs), BCC packages show much smaller parasitics in the equivalent model. In the simulation, the insertion and return losses for a packaged 50-Ω microstrip line are calculated against frequency. BCC packages are also less lossy than TSSOPs over a wide frequency range. By setting a random variable with Gaussian distribution varied within a certain range for each equivalent circuit element of the packages, the Monte Carlo analysis has been performed to study the package effects on a GaAs heterojunction bipolar transistor (HBT). Again, BCC packages cause less decrement of HBT unity-gain bandwidth than TSSOPs
  • Keywords
    Monte Carlo methods; S-parameters; UHF integrated circuits; bipolar MMIC; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; losses; microstrip lines; 1 to 12 GHz; BCC packages; GaAs HBT; Gaussian distribution; HBT unity-gain bandwidth; Monte Carlo analysis; RFIC packages; S-parameter measurement; bump chip carrier packages; electrical models; equivalent model; heterojunction bipolar transistor; insertion loss; packaged 50 ohm microstrip line; parasitics; return loss; Circuit simulation; Electric variables measurement; Frequency; Heterojunction bipolar transistors; Insertion loss; Microstrip; Packaging; Radiofrequency integrated circuits; Scattering parameters; Semiconductor device measurement;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.982843
  • Filename
    982843