DocumentCode :
1560302
Title :
Comparative investigation on numerical de-embedding techniques for equivalent circuit modeling of lumped and distributed microstrip circuits
Author :
Zhu, Lei ; Wu, Ke
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
12
Issue :
2
fYear :
2002
Firstpage :
51
Lastpage :
53
Abstract :
A so-called "short-open calibration" (SOC) technique is applied together with two existing numerical de-embedding techniques for equivalent circuit modeling of microstrip circuits based on a full-wave method-of-moments (MoM) algorithm. A stub-loaded microstrip line discontinuity with both electrically short (lumped) and long (distributed) stub lengths is extensively studied in terms of its Z-matrix circuit model. Our obtained results show that the SOC scheme allows an accurate calibration of all the potential error terms out of the core circuit network, thereby avoiding numerical noise-related behaviors regardless of either lumped or distributed circuits, which are nevertheless observed for the two existing techniques.
Keywords :
calibration; distributed parameter networks; equivalent circuits; lumped parameter networks; method of moments; microstrip circuits; microstrip discontinuities; numerical stability; two-port networks; Z-matrix circuit model; accurate calibration; admittance-type algorithm; core circuit network; distributed microstrip circuits; electrically long stub lengths; electrically short stub lengths; equivalent circuit modeling; external feed lines; full-wave method-of-moments algorithm; lumped microstrip circuits; numerical de-embedding techniques; numerical instability; potential error terms; short-open calibration; stub-loaded microstrip line discontinuity; two-ports network; Calibration; Character generation; Circuit noise; Circuit simulation; Equivalent circuits; Feeds; Iterative algorithms; Microstrip; Moment methods; Voltage;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/7260.982874
Filename :
982874
Link To Document :
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