DocumentCode :
1560360
Title :
Development of thin-film multijunction thermal converters at PTB/IPHT
Author :
Klonz, Manfred ; Laiz, Héctor ; Kessler, Ernst
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume :
50
Issue :
6
fYear :
2001
fDate :
12/1/2001 12:00:00 AM
Firstpage :
1490
Lastpage :
1498
Abstract :
The thin-film multijunction thermal converter (PMJTC) developed in cooperation between Physikalisch-Technische Bundesanstalt (PTB) and Institut fur Physikalische Hochtechnologie e.V. (IPHT) is today´s most sensitive and accurate standard for the precise measurement of electrical AC quantities in the frequency range of 10 Hz-1 MHz. Thin-film technology and micromechanics in silicon were essential for this success. The thin-film heater and bismuth/antimony thermocouples with high Seebeck effect deposited on a thin membrane of low heat conductance result in the attractively high sensitivity of the PMJTC which allows voltage measurements down to 100 mV to be performed. The statistics of the mass production of the PMJTCs show that PMJTCs built into a housing with an N-connector at the input can be reproducebly manufactured with an AC-DC voltage transfer difference smaller than 0.1 μV/V at 1 kHz, 8 μV/V up to 100 kHz, and below 40 μV/V up to 1 MHz for a heater resistance of 90 Ω. A compensation circuit has been added on the chip which results in low-frequency PMJTCs (LF-PMJTCs) with AC-DC transfer differences below 0.3 μV/V at 10 Hz
Keywords :
Seebeck effect; convertors; etching; micromachining; microsensors; thermocouples; thin film devices; transfer standards; voltage measurement; 10 Hz to 1 MHz; 90 ohm; AC-DC voltage transfer difference; anisotropic etching; compensation circuit; electrical AC quantities; high Seebeck effect; mass production; measurement standard; stress-compensated sandwich membrane; thermocouples; thin dielectric membrane; thin-film heater; thin-film multijunction thermal converter; voltage measurements; Bismuth; Electric variables measurement; Frequency conversion; Frequency measurement; Measurement standards; Semiconductor thin films; Silicon; Sputtering; Standards development; Transistors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.982933
Filename :
982933
Link To Document :
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