• DocumentCode
    1560362
  • Title

    Micromechanical voltage reference using the pull-in of a beam

  • Author

    Cretu, Edmond ; Rocha, Luis Alexandre ; Wolffenbuttel, Reinoud F.

  • Author_Institution
    DIMES, Delft Univ. of Technol., Netherlands
  • Volume
    50
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1504
  • Lastpage
    1507
  • Abstract
    The pull-in voltage of a single-side anchored freestanding beam, under lateral deflection, has been investigated for application as a DC voltage reference. Two sets of electrodes, along side the tip, are used for parallel-plate type of electrostatic actuation of the 200 μm long beam in the plane of the wafer. Another set of buried electrodes is aligned with the plate electrode at the free-standing tip and is used as a differential capacitor for the simultaneous detection of the displacement, with the purpose to determine the stability border and thus the pull-in voltage. The single-end clamping ensures that the pull-in voltage is insensitive to technology-induced stresses. A 2D energy-based analytical model for the static pull-in is compared with measurements. Bifurcation diagrams are computed numerically, based on a local continuation method. Devices have been designed and fabricated in an epi-poly process. Measurements are in agreement with modeling and confirm a pull-in voltage in the 9.1-9.5 V range. Reproducibility is limited by hysteresis and charging of the dielectric layer in between the electrodes. The device can be operated in feedback or as a seesaw, by using the two sets of electrodes
  • Keywords
    bifurcation; capacitive sensors; electrostatic actuators; finite element analysis; mechanical stability; micromachining; microsensors; semiconductor device models; transfer standards; voltage measurement; 200 micron; 9.1 to 9.5 V; DC voltage reference; bifurcation diagrams; differential capacitor; epi-poly process; feedback; finite element modeling; hysteresis; lateral deflection; local continuation method; long-term stability; micromechanical voltage reference; parallel-plate type electrostatic actuation; pull-in voltage; seesaw; single-end clamping; single-side anchored freestanding beam; stability border; static pull-in; surface micromachining; two-dimensional energy-based analytical model; Analytical models; Capacitors; Clamps; Dielectric measurements; Electrodes; Electrostatic actuators; Micromechanical devices; Stability; Stress; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.982935
  • Filename
    982935