• DocumentCode
    1560391
  • Title

    Problems with jitter measurement in PDH/SDH-based digital telecommunication systems

  • Author

    Angrisani, Leopoldo ; Baccigalupi, Aldo ; Angiolo, Giovanni D.

  • Author_Institution
    Dipt. di Informatica e Sistemistica, Univ. di Napoli Federico II, Italy
  • Volume
    50
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1672
  • Lastpage
    1678
  • Abstract
    This paper arises from criticisms, originated by telecommunication manufacturers, concerning some problems experienced during production tests of digital telecommunication apparatus. The faultfinding mainly concerns test equipment as well as recommendations currently in force for generating and measuring timing jitter in telecommunication systems based on both (PDH) plesiochronous and (SDH) synchronous digital hierarchies. In this paper, the aforementioned problems are first discussed in detail and then confirmed by some experiments carried out at the laboratories of a major Italian manufacturer. To meet the request of production managers, a novel, more accurate method for measuring jitter in PDH/SDH-based systems is proposed. Thanks to a suitable digital signal-processing solution, the method no longer needs timing recovery circuitry and shows itself insensitive to nonrectangular pulse shapes. The results obtained from the application of the method to the same data signals analyzed at the aforementioned manufacturer finally assess its reliability and capability
  • Keywords
    digital communication; production testing; signal processing; synchronisation; synchronous digital hierarchy; telecommunication equipment testing; time-domain analysis; timing jitter; Hamming window; ITU-T recommendations; PDH/SDH-based telecommunication systems; actual bit rate; digital signal-processing solution; digital telecommunication systems; fast Fourier transform; intrinsic jitter; maximum tolerable jitter measurement; output jitter measurement; phase-locked loop circuits; production tests; quality assessment; sinusoidal jitter; time-domain evolution; timing jitter measurement; Circuit faults; Current measurement; Force measurement; Jitter; Production; Pulp manufacturing; Synchronous digital hierarchy; Synchronous generators; Test equipment; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.982966
  • Filename
    982966