Title :
Proton-induced CCD charge transfer degradation at low-operating temperatures
Author :
Hopkinson, Gordon R.
Author_Institution :
Sira Electro-Optics Ltd., Chislehurst, UK
fDate :
12/1/2001 12:00:00 AM
Abstract :
Measurements of charge transfer inefficiency (CTI) at charge-coupled device temperatures ~-100°C show that proton-induced E-centers can be kept filled but other traps with energies 0.22-0.34 eV limit the achievable improvement in CTI. Estimates of trap energy levels and concentrations are made from CTI and emission time measurements. It is found that the CTI can be reduced for low signal levels. Implications for spaceborne astronomical instruments are discussed
Keywords :
astronomical instruments; charge exchange; charge-coupled devices; colour centres; cryogenic electronics; electron traps; proton effects; radiation hardening (electronics); -100 C; charge transfer inefficiency; charge-coupled device; emission time; low-operating temperatures; proton-induced CCD charge transfer degradation; proton-induced E-centers; spaceborne astronomical instruments; trap concentrations; trap energy levels; traps; Charge coupled devices; Charge measurement; Charge transfer; Current measurement; Degradation; Energy measurement; Energy states; Extraterrestrial measurements; Temperature; Time measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
