DocumentCode
1560436
Title
Single-event upset in the PowerPC750 microprocessor
Author
Swift, Gary M. ; Fannanesh, F.F. ; Guertin, Steven M. ; Irom, Farokh ; Millward, Douglas G.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
48
Issue
6
fYear
2001
fDate
12/1/2001 12:00:00 AM
Firstpage
1822
Lastpage
1827
Abstract
Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat
Keywords
fault diagnosis; integrated circuit testing; ion beam effects; microprocessor chips; proton effects; PowerPC750 microprocessor; SEE; SEU; advanced commercial processor; fault diagnosis; heavy ion upset susceptibility; interfering program malfunctions; proton upset susceptibility; radiation effects; single-event effects; single-event upset; storage elements; upset susceptibility reduction; Laboratories; Manufacturing processes; Materials testing; Microprocessors; Propulsion; Protons; Registers; Space exploration; Space missions; Space technology;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.983136
Filename
983136
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