Analog and digital single-event effects experiments in space

Author

Crain, S.H. ; Mazur, J.E. ; Katz, R.B. ; Koga, R. ; Looper, M.D. ; Lorentzen, K.R.

Author_Institution

Aerosp. Corp., El Segundo, CA, USA

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

1841

Lastpage

1848

Abstract

Field-programmable gate arrays (FPGAs) and operational amplifiers are commonly used microelectronics in spaceflight instrumentation. In ground-based testing, these devices have been shown to experience single-event upset (SEU), the digital variety for the FPGA and the analog or transient type for the op-amps. Two experiment boards on the Microelectronics and Photonics Test Bed (MPTB) test these same parts in space. The data collected to date are presented here. The most interesting results are not from the primary focus of the SEU but from the total ionizing dose (TID) current monitoring of the FPGAs

Keywords

field programmable gate arrays; integrated circuit testing; ion beam effects; operational amplifiers; proton effects; space vehicle electronics; COTS; FPGA; MPTB test; SEE; SET; SEU; analog single-event effects experiments; digital single-event effects experiments; field-programmable gate arrays; heavy ion radiation; microelectronics; microelectronics/photonics test bed; operational amplifiers; proton irradiation; radiation effects; single-event transient; single-event upset; space environment; spaceflight instrumentation; total ionizing dose current monitoring; Circuits; Field programmable gate arrays; Microelectronics; Operational amplifiers; Photonics; Rails; Single event upset; Space technology; Testing; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983140

Filename

983140