Title :
Single-chip dosimeters to accompany photometric systems flown in space
Author :
McNulty, Peter J. ; Scheick, Leif Z. ; Yow, Sushan ; Campbell, Arthur B. ; Savage, Mark W.
Author_Institution :
Dept. of Phys. & Astron., Clemson Univ., SC, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
Modern photometer systems need to be accompanied by dosimeters that monitor exposure to total ionizing dose, ultraviolet light, and the flux of particles with linear energy transfer above some threshold value. These detectors should minimize space, weight, power, cost, and telemetry. A new approach is described in which single-chip, two-chip, or three-chips systems incorporated into the photometer´s interface circuits measure the above while including information on the status of charge trapping in oxides and thermal noise at p-n junctions
Keywords :
aerospace instrumentation; dosimeters; integrated circuit measurement; integrated circuit noise; p-n junctions; photodetectors; photometers; radiation hardening (electronics); thermal noise; ultraviolet radiation effects; charge trapping; cost; interface circuits; linear energy transfer; oxides; p-n junctions; particle flux; photometer systems; photometric systems; power; single-chip; single-chip dosimeters; space; telemetry; thermal noise; three-chip systems; threshold; total ionizing dose; two-chip systems; ultraviolet light; weight; Charge measurement; Circuits; Costs; Current measurement; Detectors; Energy exchange; Monitoring; Noise measurement; Photometry; Telemetry;
Journal_Title :
Nuclear Science, IEEE Transactions on