Title :
Development of a test methodology for single-event transients (SETs) in linear devices
Author :
Poivey, Christian ; Howard, James W., Jr. ; Buchner, Steve ; LaBel, Kenneth A. ; Forney, James D. ; Kim, Hak S. ; Assad, Arheindal
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
We present single-event transient (SET) test data on linear devices under many operational conditions in an attempt to understand the SET generation and characteristics. This is done in an attempt to define a low-cost conservative test methodology to characterize these effects. Heavy ion and laser irradiation test results are reported for a variety of bipolar analog integrated circuits
Keywords :
bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; ion beam effects; laser beam effects; operational amplifiers; transients; SET generation; SETs; bipolar analog integrated circuits; heavy ion irradiation; laser irradiation; linear devices; low-cost conservative test methodology; operational amplifier; single-event transients; test methodology; voltage comparator; Aerospace electronics; Analog integrated circuits; Application software; Circuit testing; Laboratories; NASA; Operational amplifiers; Pulse amplifiers; Radiation effects; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
