Development of a test methodology for single-event transients (SETs) in linear devices

Author

Poivey, Christian ; Howard, James W., Jr. ; Buchner, Steve ; LaBel, Kenneth A. ; Forney, James D. ; Kim, Hak S. ; Assad, Arheindal

Author_Institution

NASA Goddard Space Flight Center, Greenbelt, MD, USA

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

2180

Lastpage

2186

Abstract

We present single-event transient (SET) test data on linear devices under many operational conditions in an attempt to understand the SET generation and characteristics. This is done in an attempt to define a low-cost conservative test methodology to characterize these effects. Heavy ion and laser irradiation test results are reported for a variety of bipolar analog integrated circuits

Keywords

bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; ion beam effects; laser beam effects; operational amplifiers; transients; SET generation; SETs; bipolar analog integrated circuits; heavy ion irradiation; laser irradiation; linear devices; low-cost conservative test methodology; operational amplifier; single-event transients; test methodology; voltage comparator; Aerospace electronics; Analog integrated circuits; Application software; Circuit testing; Laboratories; NASA; Operational amplifiers; Pulse amplifiers; Radiation effects; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983193

Filename

983193