Assessing the impact of the space radiation environment on parametric degradation and single-event transients in optocouplers

Author

Reed, Robert A. ; Poivey, Christian ; Marshall, Paul W. ; LaBel, Kenneth A. ; Marshall, Cheryl J. ; Kniffin, Scott ; Barth, Janet L. ; Seidleck, Christina

Author_Institution

NASA Goddard Space Flight Center, Greenbelt, MD, USA

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

2202

Lastpage

2209

Abstract

Assessing the risk of using optocouplers in satellite applications offers challenges that incorporate those of commercial off-the-shelf devices compounded by hybrid module construction techniques. We discuss approaches for estimating this risk. In the process, we benchmark our estimates for proton and heavy-ion induced single-event transient rate estimates with recent flight data from the Terra mission. For parametric degradation, we discuss a method for acquiring test data and mapping it into an estimation approach that captures all the important variables of circuit application, environment, damage energy dependence, complex response to total ionizing dose and displacement effects, temperature, and annealing

Keywords

annealing; ion beam effects; opto-isolators; proton effects; space vehicle electronics; transients; Terra mission; annealing; commercial off-the-shelf device; displacement damage; heavy ion irradiation; hybrid module; optocoupler; parametric degradation; proton irradiation; risk assessment; satellite applications; single-event transient; space environment; total ionizing dose; Aerospace electronics; Circuit testing; Degradation; Isolation technology; Isolators; Manufacturing; NASA; Packaging; Radiation effects; Space technology;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983196

Filename

983196