DocumentCode
1560743
Title
An on-sun comparison of GaInP2/GaAs tandem cells with top cell thickness varied
Author
McMahon, W.E. ; Emery, K.E. ; Friedman, D.J. ; Ottoson, L. ; Young, M.S. ; Ward, J.S. ; Kramer, Christopher M. ; Duda, A. ; Kurtz, S.
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
2005
Firstpage
715
Lastpage
718
Abstract
This study compares the on-sun performance of a set of GaInP2/GaAs tandem cells with different GaInP2 top-cell thicknesses. Because high-efficiency III-V cells are best suited to concentrating photovoltaic (CPV) applications, the cells were mounted on a two-axis tracker with the incident sunlight collimated to exclude all except the direct beam. Current-voltage (I-V) curves were taken throughout the course of several days, along with measurements of the direct solar spectrum. Our two major conclusions are: (1) GaInP2/GaAs tandem cells designed for an "air mass 1.5 global" (AM 1.5G) or a "low aerosol optical depth" (Low AOD) spectrum perform the best, and (2) cells can be characterized indoors and modeled using outdoor spectra to predict the correct result. These results are equally valid for GaInP2/GaAs/Ge triple-junction cells.
Keywords
III-V semiconductors; elemental semiconductors; gallium compounds; germanium; indium compounds; semiconductor junctions; solar cells; solar spectra; AM 1.5 G spectrum; GaInP2-GaAs-Ge; GaInP2/GaAs tandem cells; GaInP2/GaAs/Ge triple-junction cells; I-V curves; air mass 1.5 global spectrum; concentrating photovoltaic applications; current-voltage curves; direct solar spectrum; high-efficiency III-V cells; incident sunlight collimation; low AOD spectrum; low aerosol optical depth spectrum; on-sun comparison; top cell thickness; top-cell thickness; two-axis tracker; Aerosols; Current measurement; Gallium arsenide; Optical collimators; Optical design; Photovoltaic systems; Predictive models; Production; Renewable energy resources; Solar power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN
0160-8371
Print_ISBN
0-7803-8707-4
Type
conf
DOI
10.1109/PVSC.2005.1488231
Filename
1488231
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