Title :
Impact of emitter resistance mismatch on base and collector current matching in bipolar transistors
Author :
Danaie, Stéphane ; Perrotin, André ; Ghibaudo, Gérard ; Vildeuil, Jean-Charles ; Morin, Gérard ; Laurens, Michel
Author_Institution :
Central R&D, STMicroelectronics, Crolles, France
Abstract :
Bipolar transistor matching is characterized at medium and high current levels using an HF test structure. We demonstrate the predominant impact of emitter resistance mismatch on base and collector current matching at high current. To this end, we simulate base and collector mismatch thanks to the experimental values of emitter access resistance and its variations. The results of these simulations are successfully compared to the experimental data.
Keywords :
bipolar transistors; electric current; electric resistance; HF test structure; base current matching; bipolar transistor matching; collector current matching; emitter access resistance; emitter resistance mismatch; Bipolar transistors; Current density; Current measurement; Electrical resistance measurement; Frequency; Hafnium; Needles; Probes; Reproducibility of results; Testing;
Conference_Titel :
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN :
1-4244-0167-4
DOI :
10.1109/ICMTS.2006.1614295
