DocumentCode
1560905
Title
Analogue characterization of horizontal bars capacitors for smart power applications
Author
Ning, Zhenqiu ; Delecourt, Henri-Xavier ; De Schepper, Luc ; Tack, Dimitri ; Desoete, Bart ; Gillon, Renaud
Author_Institution
AMI Semicond. Belgium, Oudenaarde, Belgium
fYear
2006
Firstpage
213
Lastpage
217
Abstract
Horizontal bars capacitors are important for smart power technologies. To perform an analogue characterization of the capacitors at different temperatures and bias voltages, a novel technique based on CBCM has been developed. The unit capacitance, the temperature coefficients and the voltage linearity coefficients of the horizontal bars capacitors have been successfully extracted by the technique. The technique is proven with high resolution, high flexibility and low cost.
Keywords
capacitance measurement; capacitors; semiconductor device models; analogue characterization; bias voltages; charge-based capacitance measurement; horizontal bars capacitors; smart power applications; temperature coefficients; voltage linearity coefficients; Bars; CMOS technology; Capacitance measurement; Dielectric measurements; Linearity; MIM capacitors; MOS capacitors; Power capacitors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN
1-4244-0167-4
Type
conf
DOI
10.1109/ICMTS.2006.1614306
Filename
1614306
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