• DocumentCode
    1560905
  • Title

    Analogue characterization of horizontal bars capacitors for smart power applications

  • Author

    Ning, Zhenqiu ; Delecourt, Henri-Xavier ; De Schepper, Luc ; Tack, Dimitri ; Desoete, Bart ; Gillon, Renaud

  • Author_Institution
    AMI Semicond. Belgium, Oudenaarde, Belgium
  • fYear
    2006
  • Firstpage
    213
  • Lastpage
    217
  • Abstract
    Horizontal bars capacitors are important for smart power technologies. To perform an analogue characterization of the capacitors at different temperatures and bias voltages, a novel technique based on CBCM has been developed. The unit capacitance, the temperature coefficients and the voltage linearity coefficients of the horizontal bars capacitors have been successfully extracted by the technique. The technique is proven with high resolution, high flexibility and low cost.
  • Keywords
    capacitance measurement; capacitors; semiconductor device models; analogue characterization; bias voltages; charge-based capacitance measurement; horizontal bars capacitors; smart power applications; temperature coefficients; voltage linearity coefficients; Bars; CMOS technology; Capacitance measurement; Dielectric measurements; Linearity; MIM capacitors; MOS capacitors; Power capacitors; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
  • Print_ISBN
    1-4244-0167-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.2006.1614306
  • Filename
    1614306