Title :
Modeling skin effect with reduced decoupled R-L circuits
Author :
Mei, S. ; Ismail, Y.I.
Author_Institution :
Northwestern Univ., Evanston, IL, USA
Abstract :
On-chip conductors such as clock and power distribution networks require accurately modeling of the skin effect. Furthermore, to incorporate the skin effect in the existing generic simulation tools such as SPICE, simple frequency independent lumped-element circuit models are needed. A rule-based R-L circuit model is proposed in this paper that predicts the skin effect in the entire frequency range accurately. This circuit model only contains a few parallel branches of resistors and inductors. A maximum error in impedance values of less than 3% is achieved using only two or three constant element branches.
Keywords :
circuit simulation; equivalent circuits; integrated circuit interconnections; integrated circuit modelling; lumped parameter networks; skin effect; SPICE; clock networks; constant element branches; equivalent R-L circuit; frequency independent lumped-element circuit models; impedance value maximum error; interconnects; on-chip conductors; power distribution networks; reduced decoupled R-L circuits; resistor/inductor parallel branches; rule-based R-L circuit model; simulation tools; skin effect frequency range; skin effect modeling; Circuit simulation; Clocks; Conductors; Frequency; Network-on-a-chip; Power systems; Predictive models; Resistors; SPICE; Skin effect;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206150
