• DocumentCode
    1561126
  • Title

    19.2% efficiency n-type laser-grooved silicon solar cells

  • Author

    Guo, Jiun-Hua ; Tjahjono, Budi S. ; Cotter, Jeffrey E.

  • Author_Institution
    Centre of Excellence for Adv. Silicon Photovoltaics & Photonics, New South Wales Univ., Sydney, NSW, Australia
  • fYear
    2005
  • Firstpage
    983
  • Lastpage
    986
  • Abstract
    N-type silicon wafers have been found to have higher bulk lifetimes compared to those of boron-doped p-type silicon wafers with the same resistivity, and proved to have no light-induced degradation associated with the boron-oxygen complex. In this paper, the laser-grooved buried contact (BC) technology was used to fabricate interdigitated backside contact (IBC) solar cells on the phosphorus-doped silicon wafers. Three obstacles that hindered the performance of n-type interdigitated backside buried contact (IBBC) solar cells - parasitic shunt resistance, metallization issues, and optimization of the diffused regions - are discussed. 19.2% efficiency has been achieved on the n-type IBBC solar cell, and all BC solar cells made on the phosphorus-doped n-type silicon wafers, regardless of the crystalline growth techniques, show no light-induced degradation.
  • Keywords
    antireflection coatings; diffusion; electrical resistivity; elemental semiconductors; laser materials processing; semiconductor device metallisation; silicon; solar cells; 19.2 percent; Si; boron-doped p-type silicon wafers; boron-oxygen complex; laser-grooved buried contact; light-induced degradation; metallization; n-type interdigitated backside buried contact solar cells; n-type laser-grooved silicon solar cells; n-type silicon wafers; parasitic shunt resistance; phosphorus-doped silicon wafers; resistivity; Conductivity; Crystallization; Degradation; Metallization; Optical design; Photovoltaic cells; Silicon; Stability; State feedback; Surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488297
  • Filename
    1488297