• DocumentCode
    1561234
  • Title

    A threshold pressure switch utilizing plastic deformation of silicon

  • Author

    Huff, M.A. ; Nikolich, A.D. ; Schmidt, M.A.

  • Author_Institution
    Microsyst. Technol. Lab., MIT, Cambridge, MA, USA
  • fYear
    1991
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    The authors report on the design, fabrication, and testing of a threshold pressure switch with mechanical hysteresis. The expansion of trapped gas in a sealed cavity formed by wafer bonding is used to plastically deform a thin silicon membrane bonded over the cavity, creating a spherically shaped cap. This deformed cap exhibits mechanical hysteresis in its deflection versus pressure characteristics at the point of buckling. It is this buckling phenomenon which is used to produce the hysteresis in the pressure switch. The authors describe the fabrication and testing of devices as well as a model to predict the onset of plastic deformation in these structures. They have tested the threshold pressure switch and found that it exhibits approximately 2 psi of hysteresis. Possible applications for this threshold pressure switch are tire pressure monitoring, tactile sensor arrays, keyboards, and scales.<>
  • Keywords
    buckling; elastic hysteresis; elemental semiconductors; membranes; micromechanical devices; pressure measurement; pressure transducers; semiconductor switches; semiconductor technology; silicon; 2 psi; buckling; deflection; deformed cap; expansion; fabrication; keyboards; mechanical hysteresis; membrane; model; plastic deformation; scales; sealed cavity; spherically shaped cap; tactile sensor arrays; testing; threshold pressure switch; tire pressure monitoring; trapped gas; Biomembranes; Deformable models; Fabrication; Hysteresis; Plastics; Sensor arrays; Silicon; Switches; Testing; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-87942-585-7
  • Type

    conf

  • DOI
    10.1109/SENSOR.1991.148831
  • Filename
    148831