DocumentCode :
1561286
Title :
Response spectra analysis for transient structural responses of board-level electronic packages subjected to half-sine impact acceleration pulses
Author :
Yeh, Chang-Lin ; Tsai, Tsung-Yueh ; Lai, Yi-Shao
Author_Institution :
Stress-Reliability Lab, Adv. Semicond. Eng. Inc., Kaohsiung
Volume :
1
fYear :
2005
Abstract :
In this paper, the response spectra analysis is introduced to obtain transient structural responses of an undamped multiple degrees of freedom structural system subjected to impact acceleration pulse of a half-sine waveform. The JEDEC drop test condition B is specifically chosen to investigate transient structural responses of a board-level test vehicle comprised of a test board and a mounted package during the drop impact process. Comparisons are made between computed and measured longitudinal strains on the test board as well as time integration and response spectra solutions for stresses in the solder joint
Keywords :
electronics packaging; impact testing; reliability; solders; transient response; JEDEC drop test; board-level electronic packages; drop impact process; impact acceleration pulse; longitudinal strains; response spectra analysis; solder joints; transient structural response; Acceleration; Electronics packaging; Soldering; Strain measurement; Stress measurement; Testing; Time factors; Time measurement; Transient analysis; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614371
Filename :
1614371
Link To Document :
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