DocumentCode :
1561369
Title :
Wafer level processing on re-built wafer for chip stacking
Author :
Souriau, Jean-Charles ; Lignier, Olivier ; Val, Christian ; Charrier, Michel ; Poupon, Gilles
Author_Institution :
CEA-Grenoble-LETI, Grenoble
Volume :
1
fYear :
2005
Abstract :
Chip stacking has emerged as the best solution to reduce the packaging size (Karnezos, 2004). Several approaches are proposed by companies and laboratories and each of them presents specific advantages and drawbacks (Tummala, 2004). Today, major 3D applications are stacked memory DRAM, SRAM or flash. Moreover, cost acts as a brake on 3D expansion in SiP and further developments are necessary to reduce the packaging cost. One clearly identified way is to perform collective processes. New developments on wafer level packaging and 3D packaging are lead in a European project (called Walpack) (Poupon, 2004; Souriau, 2005) to fulfil the requirement of the company 3D-PLUS. The proposed technology aims to realise 3D modules, as 3D-PLUS already produces, but using ultra thin components inside. To realise such module, the original approach consist in reconstituting a wafer with the active sides aligned in the same plane, embedded in a resin which gives the wafer its mechanical consistency. The known good re-built chips are then stacked and 3D interconnected by means of the patented 3D-PLUS process
Keywords :
DRAM chips; SRAM chips; chip scale packaging; flash memories; interconnections; resins; system-in-package; 3D expansion; 3D interconnection; 3D modules; 3D packaging; 3D-PLUS process; DRAM; SRAM; SiP; chip stacking; flash memory; mechanical consistency; re-built wafer; system-in-package; wafer level packaging; wafer level processing; Copper; Costs; Curing; Insulation life; Packaging; Random access memory; Resins; Stacking; Testing; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614382
Filename :
1614382
Link To Document :
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