• DocumentCode
    1561369
  • Title

    Wafer level processing on re-built wafer for chip stacking

  • Author

    Souriau, Jean-Charles ; Lignier, Olivier ; Val, Christian ; Charrier, Michel ; Poupon, Gilles

  • Author_Institution
    CEA-Grenoble-LETI, Grenoble
  • Volume
    1
  • fYear
    2005
  • Abstract
    Chip stacking has emerged as the best solution to reduce the packaging size (Karnezos, 2004). Several approaches are proposed by companies and laboratories and each of them presents specific advantages and drawbacks (Tummala, 2004). Today, major 3D applications are stacked memory DRAM, SRAM or flash. Moreover, cost acts as a brake on 3D expansion in SiP and further developments are necessary to reduce the packaging cost. One clearly identified way is to perform collective processes. New developments on wafer level packaging and 3D packaging are lead in a European project (called Walpack) (Poupon, 2004; Souriau, 2005) to fulfil the requirement of the company 3D-PLUS. The proposed technology aims to realise 3D modules, as 3D-PLUS already produces, but using ultra thin components inside. To realise such module, the original approach consist in reconstituting a wafer with the active sides aligned in the same plane, embedded in a resin which gives the wafer its mechanical consistency. The known good re-built chips are then stacked and 3D interconnected by means of the patented 3D-PLUS process
  • Keywords
    DRAM chips; SRAM chips; chip scale packaging; flash memories; interconnections; resins; system-in-package; 3D expansion; 3D interconnection; 3D modules; 3D packaging; 3D-PLUS process; DRAM; SRAM; SiP; chip stacking; flash memory; mechanical consistency; re-built wafer; system-in-package; wafer level packaging; wafer level processing; Copper; Costs; Curing; Insulation life; Packaging; Random access memory; Resins; Stacking; Testing; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9578-6
  • Type

    conf

  • DOI
    10.1109/EPTC.2005.1614382
  • Filename
    1614382