DocumentCode :
1561412
Title :
Stochastic Modeling for Serial-Batching Workstations with Heterogeneous Machines
Author :
Ding, Shengwei ; Akhavan-Tabatabaei, Raha ; Shanthikumar, J. George
Author_Institution :
California Univ. Berkeley, Berkeley
fYear :
2007
Firstpage :
77
Lastpage :
81
Abstract :
The bottleneck workstation in semiconductor manufacturing is lithography. Lithography is a complex manufacturing system (CMS) and consists of multiple products, serial-batching operations, re-entrant process flows, and parallel non-identical machines. Existing stochastic models for such a CMS focus on simple extensions of the classical queueing theory. These models fail to question the applicability of the theory but try to modify model inputs on the first moment (average) and the second moment (variation). The implementation of these models has been unsatisfactory. In this paper, we provide a stochastic model of such a CMS. We model the arrival process of CMS by Poisson process and the service process by Markov decision process. We propose a geometric-distribution based probabilistic dispatching model. The model is verified using a lithography workstation in a high-volume wafer fabrication facility. This study provides a theoretic framework and promising results for serial-batching operation modeling in semiconductor manufacturing and other industries as well.
Keywords :
Markov processes; batch processing (industrial); lithography; probability; production facilities; semiconductor device manufacture; semiconductor device models; semiconductor process modelling; stochastic processes; wafer-scale integration; Markov decision process; Poisson process; complex manufacturing system; geometric-distribution based probabilistic dispatching model; heterogeneous machines; lithography; re-entrant process flows; semiconductor manufacturing; serial-batching workstations; stochastic modeling; wafer fabrication facility; Collision mitigation; Dispatching; Lithography; Manufacturing systems; Queueing analysis; Semiconductor device manufacture; Semiconductor device modeling; Solid modeling; Stochastic processes; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering, 2007. CASE 2007. IEEE International Conference on
Conference_Location :
Scottsdale, AZ
Print_ISBN :
978-1-4244-1154-2
Electronic_ISBN :
978-1-4244-1154-2
Type :
conf
DOI :
10.1109/COASE.2007.4341854
Filename :
4341854
Link To Document :
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