DocumentCode :
1561425
Title :
Process variation dimension reduction based on SVD [circuit simulation]
Author :
Li, Zhuo ; Lu, Xiang ; Shi, Weiping
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
4
fYear :
2003
Abstract :
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and timing analysis under process variation can be performed efficiently. Our algorithm reduces the number of process variation variables while preserving the delay function with respect to process variation. Compared with the principal component analysis (PCA) method, our algorithm requires less computation time and guarantees the reduced process variation variables are independent. Experimental results on ISCAS85 circuits show that the algorithm works well.
Keywords :
circuit simulation; fault simulation; integrated circuit modelling; singular value decomposition; SVD; circuit simulation; delay function preservation; fault simulation; process variation dimension reduction; process variation variable reduction; singular value decomposition; timing analysis; Analytical models; Circuit faults; Circuit simulation; Computational modeling; Delay; Independent component analysis; Performance analysis; Principal component analysis; Singular value decomposition; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
Type :
conf
DOI :
10.1109/ISCAS.2003.1206193
Filename :
1206193
Link To Document :
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