Title :
Compliance, deformation and thermal fatigue behavior of multi-copper-column interconnects
Author :
Liao, E.B. ; Tay, A.A.O. ; Ang, S.S.T. ; Feng, H.H. ; Nagarajan, R. ; Kripesh, V. ; Kumar, R. ; Mahadevan, I.
Author_Institution :
Inst. of Microelectron., Singapore
Abstract :
In this paper, macro- and micro-modeling technique is implemented to correlate the compliance, deformation and thermal fatigue damage of composite interconnect structures that consist of copper columns and solder joint. Systematic simulation results reveal the dependence of solder joint fatigue life upon four geometric parameters such as column height, column radius, solder volume and substrate pad radius. A simple model has been developed to explain the dependence of plastic strain on the interconnect compliance. This work provides guidance for design of composite interconnect structure that is meant to enhance the solder joint reliability by incorporation of flexible structures
Keywords :
composite material interfaces; copper; flexible electronics; integrated circuit interconnections; plastic deformation; reliability; solders; thermal stress cracking; Cu; composite interconnect structures; flexible structures; interconnect compliance; macro-modeling technique; micro-modeling technique; multi-copper-column interconnects; plastic strain; solder joint fatigue life; solder joint reliability; thermal fatigue damage; Capacitive sensors; Copper; Deformable models; Fatigue; Plastics; Soldering; Solid modeling; Structural beams; Thermal force; Thermomechanical processes;
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
DOI :
10.1109/EPTC.2005.1614395