• DocumentCode
    1561486
  • Title

    Absorption in thin Si films with randomly formed subwavelength structures

  • Author

    Zaidi, Saleem H. ; Matzke, Carolyn ; Koltunski, Laure ; DeZetter, Karen

  • Author_Institution
    Gratings Inc., Albuquerque, NM, USA
  • fYear
    2005
  • Firstpage
    1145
  • Lastpage
    1148
  • Abstract
    Thin-film (<25 μm) solar cells are desirable due to their low cost and reduced bulk recombination losses. However, due to weak near infrared optical absorption of c-Si, cell efficiency is poor. Due to their large feature dimensions, geometrical texturing techniques are not suitable for thin film solar cells. We have investigated subwavelength diffractive optical approach to reduce surface reflection as well as enhance near IR optical absorption. For experimental evaluation, thinned Si films were bonded to pyrex and randomly textured to form subwavelength surfaces. A metal film was deposited on the back surface to achieve optical confinement. Near-incidence spectral optical measurements showed ∼100% optical absorption over 400-1200-nm spectral range. Rigorous coupled wave analysis was used to demonstrate diffractive scattering into diffraction orders was responsible for optical absorption.
  • Keywords
    elemental semiconductors; infrared spectra; light diffraction; light scattering; reflectivity; silicon; solar cells; texture; thin film devices; visible spectra; bulk recombination losses; cell efficiency; coupled wave analysis; diffractive scattering; geometrical texturing techniques; metal film; near infrared optical absorption; optical confinement; pyrex; randomly formed subwavelength structures; subwavelength diffractive optical approach; surface reflection; thin-film solar cells; Costs; Electromagnetic wave absorption; Geometrical optics; Optical diffraction; Optical films; Optical scattering; Optical surface waves; Photovoltaic cells; Semiconductor films; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488340
  • Filename
    1488340