DocumentCode
1561496
Title
Advanced dry processes for crystalline silicon solar cells
Author
Agostinelli, G. ; Choulat, P. ; Dekkers, H.F.W. ; De Wolf, S. ; Beaucarne, G.
Author_Institution
IMEC, Leuven, Belgium
fYear
2005
Firstpage
1149
Lastpage
1152
Abstract
Significant cost reduction of bulk crystalline silicon solar cells requires the removal of the technological barriers that impede the development of a high throughput, low cost, and reliable industrial process on thin substrates. Present industrial surface conditioning and rear surface passivation processes do not meet the requirements for yield and performance on thin substrates. In addition, large-scale production brings about the issue of the environmental impact of PV processing and its related externalities, which may contribute a significant part of the final costs and are so far, underestimated or belittled. In this paper we present an advanced, plasma-based processing technology, suitable for industrial production of bulk silicon solar cells on thin substrates and capable of meeting the PV market growth challenge with a low environmental impact and a competitive cost. The modified processing steps include plasma etching and texturing, dielectric passivation and rear side local contact schemes. Each step is compatible with the standard process sequence, can be integrated separately in the production line and leads to improved performance and/or cost reduction.
Keywords
elemental semiconductors; passivation; silicon; solar cells; sputter etching; Si; crystalline silicon solar cells; dielectric passivation; dry processes; environmental impact; industrial surface conditioning; large-scale production; plasma etching; plasma-based processing technology; rear side local contact schemes; rear surface passivation processes; texturing; Costs; Crystallization; Dielectric substrates; Passivation; Photovoltaic cells; Plasma applications; Plasma materials processing; Production; Silicon; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN
0160-8371
Print_ISBN
0-7803-8707-4
Type
conf
DOI
10.1109/PVSC.2005.1488341
Filename
1488341
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