Concurrent optimization of process dependent variations in different circuit performance measures

Author

Mutlu, Ayhan A. ; Gunther, Norman G. ; Rahman, Mahmud

Author_Institution

Dept. of Electr. Eng., Santa Clara Univ., CA, USA

Volume

4

fYear

2003

Abstract

A method for multi-objective circuit variability optimization in the presence of process variations is presented. Critical process parameter variations are identified by determining their correlations to the circuit performance measures of interest. Then, the distributions of these critical process parameters are used to identify the critical designable parameters for variability optimization. Membership functions and fuzzy set intersection operators are used to transform multiple design objectives into a single objective function suitable for optimization. Afterwards, the objective function for variability is minimized. Finally, the mean circuit performance measures are fine tuned for given target specifications.

Keywords

CMOS digital integrated circuits; circuit optimisation; circuit simulation; delay circuits; fuzzy set theory; hypercube networks; integrated circuit design; minimisation of switching nets; CMOS circuit designable parameters; Latin hypercube sampling; circuit performance measures; concurrent optimization; critical designable parameters; critical process parameter variations; delay circuit; fuzzy set intersection operators; high quality ICs; membership functions; multi-objective circuit variability optimization; objective function; process dependent variations; simulation results; variability optimization; Circuit optimization; Circuit simulation; Delay; Design optimization; Electric variables measurement; Electron devices; Hypercubes; Laboratories; Manufacturing processes; Sampling methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on

Print_ISBN

0-7803-7761-3

Type

conf

DOI

10.1109/ISCAS.2003.1206215

Filename

1206215