Title :
Basic electronic properties and optimization of TCO/a-Si:H(n)/c-Si(p) hetero solar cells
Author :
Maydell, K.V. ; Schmidt, M. ; Korte, L. ; Laades, A. ; Conrad, E. ; Stangl, R. ; Scherff, M. ; Fuhs, W.
Author_Institution :
Hahn-Meitner-Inst., Berlin, Germany
Abstract :
We report on a detailed analysis of the basic electronic properties and the optimization of amorphous/crystalline silicon heterojunction solar cells (a-Si:H(n)/c-Si(p)). The gap states density of the ultrathin a-Si:H emitter on c-Si was determined by photoelectron yield spectroscopy. By varying the a-Si:H film thickness the valence band offset was determined to about 0.45 eV. The density of states at the a-Si:H/c-Si interface amounts to about 2×1011cm-2eV-1 at midgap. This result was obtained by field dependent surface photovoltage measurements. In addition, photoluminescence measurements were performed to investigate the recombination at the a-Si:H/c-Si interface. To gain an optimized solar cell performance the deposition temperature of the a-Si:H and the gas phase doping concentration was varied. These optimizations lead to a maximum efficiency of 17.2% for a TCO/a-Si:H(n)/c-Si(p)/a-Si:H(p) solar cell fabricated using low temperature processes only.
Keywords :
amorphous semiconductors; electronic density of states; elemental semiconductors; hydrogen; interface states; photoelectron spectra; photoluminescence; semiconductor doping; semiconductor heterojunctions; silicon; solar cells; surface photovoltage; valence bands; 17.2 percent; Si-Si:H; amorphous-crystalline silicon heterojunction solar cells; density of states; gap states density; gas phase doping; hetero solar cells; photoelectron yield spectroscopy; photoluminescence; surface photovoltage measurements; ultrathin a-Si:H emitter; valence band; Amorphous materials; Crystallization; Heterojunctions; Performance evaluation; Performance gain; Photoluminescence; Photovoltaic cells; Silicon; Spectroscopy; Temperature;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488360