DocumentCode
1561695
Title
High-throughput approaches to optimization of crystal silicon surface passivation and heterojunction solar cells
Author
Wang, Qi ; Page, Matt ; Yan, Yanfa ; Wang, Tihu
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
2005
Firstpage
1233
Lastpage
1236
Abstract
We use a high-throughput (combinatorial) hot-wire chemical vapor deposition system to passivate the crystal silicon surface and to grow heterojunction silicon solar cells. We study the effectiveness of crystal surface treatments by atomic H or/and NHx radicals, followed by the growth of thin hydrogenated amorphous silicon (a-Si:H) films. Treatment and layer properties such as times, thicknesses and gas mixtures can be continuously graded, creating a two-dimensional sample with each variable varying in one direction. This results in high-throughput optimization of the processes. Effective carrier lifetime is measured by photoconductive decay to evaluate the effectiveness of the surface passivation by surface treatments. The effective carrier lifetime increases from about 5 μs without passivation to about 24 μs with an optimized surface treatment and thickness a-Si:H on single-sided c-Si. Transmission electron microscopy reveals that a-Si:H, a mixed phase, or epitaxial growth of thin-film Si depending upon the surface treatment. Improvement in effective carrier lifetime correlates to with an immediate a-Si:H growth on c-Si, rather than a mixed phase and epitaxial Si growth. We have obtained an efficiency of 13.4% on a non-textured single-sided heterojunction solar cell on a p-type CZ-Si processed with optimized surface treatment.
Keywords
carrier lifetime; chemical vapour deposition; elemental semiconductors; passivation; photoconductivity; semiconductor epitaxial layers; semiconductor growth; semiconductor heterojunctions; silicon; solar cells; surface treatment; transmission electron microscopy; Si; carrier lifetime; crystal silicon surface passivation; epitaxial growth; heterojunction silicon solar cells; hot-wire chemical vapor deposition; photoconductive decay; surface treatment; thin hydrogenated amorphous silicon; transmission electron microscopy; Amorphous silicon; Atomic layer deposition; Atomic measurements; Charge carrier lifetime; Chemical vapor deposition; Heterojunctions; Passivation; Photovoltaic cells; Semiconductor films; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN
0160-8371
Print_ISBN
0-7803-8707-4
Type
conf
DOI
10.1109/PVSC.2005.1488362
Filename
1488362
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