DocumentCode :
1561914
Title :
Straighforward in-line processing for a 16.8% efficient mc-Si solar cell
Author :
Tool, C.J.J. ; Coletti, G. ; Granek, F.J. ; Hoornstra, J. ; Koppes, M. ; Kossen, E.J. ; Rieffe, H.C. ; Romjin, I.G. ; Weeber, A.W.
Author_Institution :
ECN Solar Energy, Petten, Netherlands
fYear :
2005
Firstpage :
1324
Lastpage :
1327
Abstract :
A simple in-line industrial process has been developed for commercial multicrystalline silicon (mc-Si) which results in solar cells with an average efficiency of 16.5%. The best cell has an efficiency of 16.8%. These are the highest efficiencies reported for full inline processing. The process consists of an acidic etch for texturing, homogeneous spin-on phosphorous and a belt furnace emitter diffusion, MicroWave PECVD for silicon nitride layers, and screen-printed metallization. The silicon nitride layer serves as antireflection coating and provides bulk and surface passivation. Detailed characterization and computer simulation showed that implementation of already proven technologies in the current cell processing could lead to efficiencies close to 18%.
Keywords :
antireflection coatings; diffusion; elemental semiconductors; etching; firing (materials); passivation; phosphorus; plasma CVD; semiconductor device metallisation; silicon; silicon compounds; solar cells; surface texture; 16.8 percent; MicroWave PECVD; Si:P; SiN; antireflection coating; belt furnace emitter diffusion; commercial multicrystalline silicon; homogeneous spin-on phosphorous; inline processing; passivation; screen-printed metallization; silicon nitride layers; solar cell; texturing; Belts; Electromagnetic heating; Etching; Furnaces; Infrared heating; Metallization; Performance evaluation; Photovoltaic cells; Reflectivity; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488385
Filename :
1488385
Link To Document :
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