DocumentCode :
1562064
Title :
Qualification of phase change thermal interface material for wave solder heat sink on FCBGA package
Author :
Bharatham, Logendran ; Fong, Wong Shaw ; Torresola, Javier ; Koang, Chen Chee
Author_Institution :
Intel Technol.
Volume :
2
fYear :
2005
Abstract :
This paper reports the outcome of multiple environmental stresses subjected to quantify the thermal impedance value (Rjs) of a phase change thermal interface material for wave solder heat sink on a bare die FCBGA package. Based on the accelerated reliability stresses, statistical models were created where possible to represent Rjs performance over time at use condition and temperatures using modifed Arrhenius type of equations. The lack of adequate pressure on the TIM produced significant material degradation in bake. However, the post reliability Rjs derived was still below the thermal design target of 1.96 degCcm2/W which, indicates that the TIM material can sufficiently cool the package until the end of its use life
Keywords :
ball grid arrays; flip-chip devices; heat sinks; phase change materials; reliability; statistical analysis; thermal management (packaging); wave soldering; Arrhenius equations; FCBGA package; accelerated reliability stresses; material degradation; multiple environmental stresses; phase change thermal interface material; statistical models; thermal impedance value; wave solder heat sink; Acceleration; Equations; Heat sinks; Impedance; Packaging; Phase change materials; Qualifications; Temperature distribution; Thermal degradation; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
Type :
conf
DOI :
10.1109/EPTC.2005.1614462
Filename :
1614462
Link To Document :
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