DocumentCode :
1562083
Title :
Yield optimization with correlated design parameters and non-symmetrical marginal distributions
Author :
Ponnambalam, K. ; Seifi, A. ; Vlach, J.
Author_Institution :
Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
Volume :
4
fYear :
2003
Abstract :
This paper extends the recently developed hybrid method to find the optimal designs of systems with correlated non-gaussian random parameters. A double-bounded density function is used to approximate marginal distribution and a Frank copula is used to define dependence (a more general concept than correlation) among the random parameters. We use a Piecewise Ellipsoidal method to approximate the constraint region by a set of quadratic functions. The yield is estimated by a joint cumulative density function over a portion of the tolerance body contained in the feasible region. Yield maximization is done for positive and negative correlations and non-symmetrical marginal distributions, and tested on an example using Monte-Carlo simulation.
Keywords :
Monte Carlo methods; circuit optimisation; integrated circuit design; integrated circuit yield; Frank copula; Monte Carlo simulation; constraint region approximation; correlated nonGaussian random parameters; cumulative density function; double-bounded probability density function; hybrid method; integrated circuit; nonsymmetrical marginal distribution; optimal design; piecewise ellipsoidal approximation; quadratic function; yield optimization; Constraint optimization; Density functional theory; Design engineering; Design optimization; Hypercubes; Industrial engineering; Probability density function; Systems engineering and theory; Testing; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
Type :
conf
DOI :
10.1109/ISCAS.2003.1206268
Filename :
1206268
Link To Document :
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