Title :
The method research of non-contact thickness measurement of transparent object with free-form surface
Author :
Wei, Wang ; Zaili, Dong ; Changyou, Liu
Author_Institution :
Inst. of Inf. Sci. & Eng., Shenyang Univ. of Technol., China
Abstract :
This paper presents the method and algorithm for surface 3D information and thickness measurement of the free-form transparent objects. The measurement method based, on the principle of structure light. The analysis of the structure light was represented and the experiment results were given. The validity of the method was proved in this paper.
Keywords :
image sensors; thickness measurement; CCD image sensors; free form surface; noncontact thickness measurement; structure light analysis; surface 3D information; transparent object; Educational institutions; Information science; Laboratories; Paper technology; Robotics and automation; Thickness measurement; Transportation;
Conference_Titel :
Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
Print_ISBN :
0-7803-8273-0
DOI :
10.1109/WCICA.2004.1342208
