• DocumentCode
    1562185
  • Title

    Texture properties of TCO uniquely determining light trapping in thin-film silicon solar cells

  • Author

    Schade, H. ; Lechner, P. ; Geyer, R. ; Stiebig, H. ; Rech, B. ; Kluth, O.

  • Author_Institution
    RWE SCHOTT Solar GmbH, Putzbrunn, Germany
  • fYear
    2005
  • Firstpage
    1436
  • Lastpage
    1439
  • Abstract
    In superstrate thin-film solar cells a surface texture of the transparent conductive oxide (TCO) front contact is used to enhance short-circuit currents by both increasing the light input into the cell from refractive index grading and causing light trapping from optical scattering. The haze and root-mean-square roughness are inadequate to quantitatively account for increased light absorption and hence enhanced short-circuit currents. Rather, angle-resolved scattering combined with scattering-efficient components of the texture details were evaluated for different types of TCO materials to yield a fairly universal correlation between short-circuit currents and large-angle scattering, weighted by a texture-dependent scattering efficiency.
  • Keywords
    elemental semiconductors; light scattering; radiation pressure; refractive index; short-circuit currents; silicon; solar cells; surface texture; thin film devices; transparency; Si; TCO; angle-resolved scattering; large-angle scattering; light absorption; light trapping; optical scattering; refractive index; root-mean-square roughness; short-circuit currents; superstrate thin-film solar cells; surface texture; thin-film silicon solar cells; transparent conductive oxide front contact; Conductive films; Light scattering; Optical films; Optical scattering; Photovoltaic cells; Rough surfaces; Semiconductor thin films; Silicon; Surface roughness; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488411
  • Filename
    1488411