DocumentCode :
1562185
Title :
Texture properties of TCO uniquely determining light trapping in thin-film silicon solar cells
Author :
Schade, H. ; Lechner, P. ; Geyer, R. ; Stiebig, H. ; Rech, B. ; Kluth, O.
Author_Institution :
RWE SCHOTT Solar GmbH, Putzbrunn, Germany
fYear :
2005
Firstpage :
1436
Lastpage :
1439
Abstract :
In superstrate thin-film solar cells a surface texture of the transparent conductive oxide (TCO) front contact is used to enhance short-circuit currents by both increasing the light input into the cell from refractive index grading and causing light trapping from optical scattering. The haze and root-mean-square roughness are inadequate to quantitatively account for increased light absorption and hence enhanced short-circuit currents. Rather, angle-resolved scattering combined with scattering-efficient components of the texture details were evaluated for different types of TCO materials to yield a fairly universal correlation between short-circuit currents and large-angle scattering, weighted by a texture-dependent scattering efficiency.
Keywords :
elemental semiconductors; light scattering; radiation pressure; refractive index; short-circuit currents; silicon; solar cells; surface texture; thin film devices; transparency; Si; TCO; angle-resolved scattering; large-angle scattering; light absorption; light trapping; optical scattering; refractive index; root-mean-square roughness; short-circuit currents; superstrate thin-film solar cells; surface texture; thin-film silicon solar cells; transparent conductive oxide front contact; Conductive films; Light scattering; Optical films; Optical scattering; Photovoltaic cells; Rough surfaces; Semiconductor thin films; Silicon; Surface roughness; Surface texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488411
Filename :
1488411
Link To Document :
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