Title :
Electrical characteristics of multi-layer power distribution grids
Author :
Mezhiba, Andrey V. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Abstract :
The design of robust and area efficient power distribution networks for high speed, high complexity integrated circuits has become a challenging task. The integrity of the high frequency signals depends upon the impedance characteristics of the on-chip power distribution networks. The electrical characteristics of these multi-layer power distribution grids and the relevant design implications are the subject of this paper. Each grid layer within a multilayer power distribution grid typically has significantly different electrical properties. Unlike single layer grids, the electrical characteristics of a multi-layer grid can vary significantly with frequency. As the frequency increases, a large share of the current flow is transfered from the low resistance upper layers to the low inductance lower layers. The inductance of a multi-layer grid therefore decreases with frequency, while the resistance increases with frequency. Therefore, as compared to power distribution grids built exclusively in the upper, low resistance metal layers, a multi-layer power distribution grid extending to the lower interconnect layers exhibits superior high frequency impedance characteristics. An analytic model is also presented to determine the impedance characteristics of a multi-layer grid from the inductive and resistive properties of the comprising individual grid layers.
Keywords :
high-speed integrated circuits; integrated circuit design; integrated circuit modelling; power supply circuits; analytic model; electrical characteristics; high-frequency signal integrity; high-speed integrated circuit design; impedance properties; on-chip multilayer power distribution grid; Electric resistance; Electric variables; Frequency; High speed integrated circuits; Impedance; Inductance; Network-on-a-chip; Power distribution; Power systems; Robustness;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206321