• DocumentCode
    1562682
  • Title

    Performance test of amorphous silicon modules in different climates - year three: higher minimum operating temperatures lead to higher performance levels

  • Author

    Ruther, Ricardo ; Tamizh-Man, G. ; del Cueto, J. ; Adelstein, J. ; Dacoregio, M.M. ; von Roedern, B.

  • Author_Institution
    Departamento de Engenharia Civil, Univ. Fed. de Santa Catarina, Florianopolis, Brazil
  • fYear
    2005
  • Firstpage
    1635
  • Lastpage
    1638
  • Abstract
    This paper presents third year results of a round robin exposure experiment designed to assess the performance of thin-film amorphous silicon (a-Si) solar modules operating in different climatic conditions. Three identical sets of commercially available a-Si PV modules from five different manufacturers were simultaneously deployed outdoors in three sites with distinct climates (Arizona -USA, Colorado - USA and Florianopolis - Brazil). Every year all PV module sets were sent to the National Renewable Energy Laboratory (NREL) for standard testing conditions measurements under a SPIRE simulator. The four-year experiment aims to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to monitor and compare degradation rates in different climates. We present results from the first three years of measurements, showing that while most of the manufacturers underrate their products by 20 to 25% to account for the light-induced degradation, outdoor exposure temperature seems to be what will ultimately determine the stabilized performance level of a-Si.
  • Keywords
    amorphous semiconductors; silicon; solar cells; testing; thin film devices; National Renewable Energy Laboratory; SPIRE simulator; amorphous silicon modules; light-induced degradation; round robin exposure experiment; stabilization characteristics; standard testing conditions; thin-film amorphous silicon solar modules; Amorphous silicon; Degradation; Laboratories; Manufacturing; Measurement standards; Renewable energy resources; Round robin; Semiconductor thin films; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488459
  • Filename
    1488459