Title :
A deterministic dynamic element matching approach to ADC testing
Author :
Olleta, Beatriz ; Juffer, Lance ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is used to generate an excitation for a DUT that has linearity that far exceeds that of the test stimulus. Simulation results show that both methods can be used for testing of ADCs but with a substantial reduction in the number of samples required for the deterministic DEM method. This technique of using an imprecise excitation to test an accurate ADC offers potential for use in both production test and BIST environments.
Keywords :
analogue-digital conversion; built-in self test; circuit testing; digital-analogue conversion; ADC testing; BIST; DUT linearity; deterministic dynamic element matching; imprecise excitation; nonideal DAC excitation signal generator; production test; random DEM; sample number reduction; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Digital-analog conversion; Linearity; Production; Resistors; Signal generators; Silicon;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206341
