Title :
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance
Author :
Parthasarathy, Kumar L. ; Jin, Le ; Kuyel, Turker ; Price, Dana ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A new histogram based algorithm for characterization of analog-to-digital converters has been introduced. The proposed method is based on using a highly nonlinear but stationary signal, which can be easily and practically generated on chip. This not only relaxes the requirement on the signal generator, but also enables the use of fast sources, thereby reducing test time and test costs. Experimental test results on commercially available 10 bit pipelined ADCs indicate that the algorithm can estimate the linearity specifications of the device to within 0.5 LSB by using an input signal of just 2 bit linearity.
Keywords :
analogue-digital conversion; built-in self test; integrated circuit testing; signal generators; 10 bit; A/D converter performance characterization; BIST; analog-to-digital converters; device linearity; nonlinear stationary signal; on chip generated test signal; pipelined ADC; signal generator; test cost reduction; test time reduction; Automatic testing; Built-in self-test; Circuit testing; Costs; Histograms; Linearity; Neodymium; Nonlinear equations; Signal generators; Signal processing algorithms;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206343
