• DocumentCode
    1562804
  • Title

    Ellipse detection based on improved-GEVD technique

  • Author

    Yang, Zhong-gen ; Jiang, Gui-Xiang ; Ren, Lei

  • Author_Institution
    Dept. of Electron. Eng., Shanghai Maritime Univ., China
  • Volume
    5
  • fYear
    2004
  • Firstpage
    4181
  • Abstract
    The standard generalized eigen value decomposition (GEVD) is a popular ellipse detection technique whose statistical analysis is given to prove its disadvantages of very big estimation bias and MSE. It is also proved that the effective measurement to improve the performance of ellipse detection is whitening the data noise and regularizing data observation. This theoretic analysis has strongly supported the Hartley´s regularization method. Then, an improved-GEVD algorithm has been developed. The theoretical analysis and computer simulation experiments have demonstrated that the proposed technique has the advantages that it is intrinsically able to whiten the data noise and to regularize the data observation so as to output a non-biased estimation of ellipse parameter with very small MSE. Furthermore, the computation complex is largely simplified.
  • Keywords
    computational complexity; curve fitting; eigenvalues and eigenfunctions; image recognition; mean square error methods; parameter estimation; statistical analysis; Hartley regularization method; MSE; computation complex; computer simulation; data noise; data observation; ellipse detection; ellipse parameter; generalized eigen value decomposition; nonbiased estimation; statistical analysis; Colored noise; Computer simulation; Data mining; Equations; Image recognition; Matrix decomposition; Noise measurement; Parameter estimation; Robot vision systems; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
  • Print_ISBN
    0-7803-8273-0
  • Type

    conf

  • DOI
    10.1109/WCICA.2004.1342296
  • Filename
    1342296