Title :
A displacement-to-voltage converter circuit using a switched-capacitor technique
Author :
Lien, K.L. ; Quek, B.S. ; Walia, R.
Author_Institution :
Inst. of Microelectron., Singapore, Singapore
Abstract :
A technique for precise measurement of changes in displacement of capacitor gap is presented. In order to obtain a linear relationship between the output voltage and changes in capacitor gap over a wide dynamic range, a novel switched-capacitor circuit has been applied. This circuit has been implemented in 0.8 μm CMOS process. Results showed that the theoretical values match that of measurement results with accuracy up to 1%.
Keywords :
CMOS integrated circuits; capacitive sensors; convertors; displacement measurement; switched capacitor networks; 0.8 micron; CMOS process; capacitive sensor; capacitor gap; displacement measurement; displacement-to-voltage converter; dynamic range; switched-capacitor circuit; Capacitance measurement; Capacitive sensors; Dynamic range; Equations; Operational amplifiers; Semiconductor device measurement; Switched capacitor circuits; Switching circuits; Switching converters; Voltage;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1206361
