Title :
A novel real-time opto-electronic profilometer using FFT processing
Author :
Halsall, G.R. ; Burton, D.R. ; Lalor, M.J. ; Hobson, C.A.
Author_Institution :
Coherent & Electro-Opt. Res. Group, Liverpool Polytech., UK
Abstract :
An instrument that accurately measures the profile of a surface in a real-time environment is proposed. The theoretical basis of the device is presented, with an explanation of how, through the analysis of fringe patterns using the fast Fourier transform, geometric parameters of a surface can be obtained. Hardware requirements for the proposed device are discussed, showing how the processing power and short cycle time of the TMS 320C25 digital signal processor (DSP) are used. The range of applications of this type of instrument is considered
Keywords :
computerised instrumentation; digital signal processing chips; fast Fourier transforms; optoelectronic devices; real-time systems; surface topography measurement; DSP; FFT processing; TMS 320C25 digital signal processor; fast Fourier transform; fringe patterns analysis; geometric parameters; real-time opto-electronic profilometer; surface profile measurement; Cameras; Counting circuits; Demodulation; Equations; Fourier transforms; Frequency modulation; Interference; Phase modulation; RF signals; Signal analysis;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1989. ICASSP-89., 1989 International Conference on
Conference_Location :
Glasgow
DOI :
10.1109/ICASSP.1989.266759
