A novel real-time opto-electronic profilometer using FFT processing

Author

Halsall, G.R. ; Burton, D.R. ; Lalor, M.J. ; Hobson, C.A.

Author_Institution

Coherent & Electro-Opt. Res. Group, Liverpool Polytech., UK

fYear

1989

Firstpage

1634

Abstract

An instrument that accurately measures the profile of a surface in a real-time environment is proposed. The theoretical basis of the device is presented, with an explanation of how, through the analysis of fringe patterns using the fast Fourier transform, geometric parameters of a surface can be obtained. Hardware requirements for the proposed device are discussed, showing how the processing power and short cycle time of the TMS 320C25 digital signal processor (DSP) are used. The range of applications of this type of instrument is considered

Keywords

computerised instrumentation; digital signal processing chips; fast Fourier transforms; optoelectronic devices; real-time systems; surface topography measurement; DSP; FFT processing; TMS 320C25 digital signal processor; fast Fourier transform; fringe patterns analysis; geometric parameters; real-time opto-electronic profilometer; surface profile measurement; Cameras; Counting circuits; Demodulation; Equations; Fourier transforms; Frequency modulation; Interference; Phase modulation; RF signals; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Acoustics, Speech, and Signal Processing, 1989. ICASSP-89., 1989 International Conference on

Conference_Location

Glasgow

ISSN

1520-6149

Type

conf

DOI

10.1109/ICASSP.1989.266759

Filename

266759